From the Editor's Desk

-- Lisa Hacker

In this issue of Reliability Edge, we have given the publication a fresh new look while continuing to offer informative and innovative articles prepared by ReliaSoft’s active R&D staff. This includes a discussion regarding the application of DOE analysis techniques for life data and an overview of three commonly used approaches for reliability prediction of electronic products.

In addition, we are especially pleased to be able to include another guest submission in this issue. We present an article on the nonhomogeneous poisson process (NHPP) model, which was written by Dr. Vasiliy Krivtsov of Ford Motor Company. We greatly appreciate Dr. Krivtsov’s contribution.