RCM++ System Configurations and Equipment Selection

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RCM++
Reliability Centered Maintenance (RCM) Software

Features Summary (Page 1)

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Support for Large Multi-Level System Configurations
RCM++'s flexible System Hierarchy panel allows you to manage large multi-level system configurations with an unlimited number of levels and an unlimited number of items within each level. You can fully define the equipment properties (such as supplier, part number, expected operating environment, etc.) for each item and perform the analysis at any level within the system configuration.

To facilitate data entry, you can copy/paste sections of the configuration, import sections from another analysis, promote/demote branches of the hierarchy with the click of a button and much more. The software also provides a simple Excel template for importing configuration data from an outside data source, such as a Bill of Materials (BOM) system.

System Hierarchy

Equipment Selection
In order to focus resources where they can provide the greatest benefit, RCM++ supports two configurable methods for selecting the equipment that will be analyzed with Reliability Centered Maintenance (RCM) techniques: Selection Questions and Criticality Factors.

Selection Questions
The Selection Questions method provides a series of yes/no questions, where "Yes" indicates that the equipment should be considered for RCM analysis. RCM++ is shipped with the questions in the major published guidelines (such as MSG-3, RAC, etc.) and allows you to customize the questions to meet particular needs.

Equipment Selection using Yes/No questions. [Click to Enlarge]

Criticality Factors
The Criticality Factors method provides a set of factors contributing to equipment criticality that can be rated on a pre-defined scale (e.g. downtime, potential for injury, impact on scrap, etc.). The sum of all ratings can be used to compare and prioritize equipment. These factors and rating scales are also fully configurable to meet your specific analysis requirements.

Equipment Selection using Criticality Factors. [Click to Enlarge]