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ReliaSoft
> Consulting
> Bios > McBride
Dr.
James N. McBride |
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Dr.
McBride spent 28 years at IBM as a Manufacturing, Supplier Quality, and
Development Engineer. During that time he participated in developing many short
courses. He also conducted more than 200 short courses in Design of Experiments
(DOE), Statistical Process Control (SPC), Basic Statistics, and Reliability
Engineering for IBM. Dr. McBride has been a full time consultant for the past ten years. As a consultant he has developed and delivered courses worldwide in FMEA and Root Cause Failure Analysis in addition to DOE, SPC, Reliability Analysis, and Basic Statistical Methods. His consulting experience includes analyzing factorial experiments in reliability, and using FMEA and DOE methods to evaluate and solve design and manufacturing problems on components and processes. In 1995 he spent 12 months as Expert Consultant to the Standards and Industrial Research Institute (SIRIM) of Malaysia where he established a Reliability and Quality Testing Laboratory for Electrical and Electro Mechanical parts and assemblies. The assignment also included instructing more than 15 short courses in Reliability, SPC, Basic Statistics and Design of Experiments. During the past 4 years Dr. McBride has conducted over 25 short courses in Black Belt training for Motorola Inc., and Seagate Inc both in the U.S. and abroad. These courses covered material in QFD, FMEA, Reliability, DOE, SPC, Capability Analysis, and Accelerated Life Testing. Dr. McBride is a long-standing member of the Institute of Electrical and Electronics Engineers (IEEE) Reliability Society and the American Society for Quality (ASQ). He is also a Certified Reliability Engineer (CRE). |
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